EDN

Inspecting the wafer test

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

Global Probe Card Market Poised for Strong Growth as Semiconductor Testing Demand and Advanced Chip Architectures Accelerate: Verified Market Research®

The global probe card market is experiencing sustained growth driven by rising semiconductor complexity, increasing wafer-level testing requirements, and rapid adoption of advanced packaging ...
EDN

Contactless Testing Wafer Testing

STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, announced the successful production of the world’s first semiconductor wafer whose ...
Semiconductor Engineering

Wafer-Level Test Infrastructure for Higher Parallel Wafer Level Testing of SoC

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

Why Aehr Test Systems Rallied This Week

Shares of semiconductor testing company Aehr Test Systems (NASDAQ: AEHR) rallied 30.6% this week through Friday at 2:33 p.m.
Seeking Alpha

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...
Digi Times

TSMC’s top wafer testing partner posts 78% surge as new facility ramps

Xintec Inc., TSMC's backend packaging and testing unit, posted a strong second-quarter 2025 rebound in wafer probe revenue, driven by increased outsourcing from TSMC and the accelerated ramp of a ...
Semiconductor Engineering

Wafer Test Challenges For Chiplets

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage.
Nasdaq

Aehr Announces New Advanced Testing Capabilities on its FOX-P™ Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies

FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released ...
InvestorsHub on MSN

Aehr Test shares jump 13% after securing silicon photonics system order

Shares of Aehr Test Systems (NASDAQ:AEHR) climbed 13% after the company revealed it had received an initial order from a new ...
Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...